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Miniaturized transportable evaporator for molecule deposition
inside cryogenic scanning probe microscopes
K. Lämmle, A. Schwarz, and R. Wiesendanger,
Rev. Sci. Instr. 81 053902 (2010)
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Atomic-resolution three-dimensional force and damping maps of carbon nanotube peapods
M. Ashino, D. Obergfell, M. Haluska, S. Yang, A. N. Khlobystov, S. Roth, and R. Wiesendanger,
Nanotechnology 20 264001 (2009)
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Hydrogen-related contrast in atomic force microscopy
R. Schmidt, A. Schwarz, and R. Wiesendanger,
Nanotechnology 20 264007 (2009)
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Revealing Subsurface Vibrational Modes by Atom-Resolved Damping Force Spectroscopy
M. Ashino, R. Wiesendanger, A. N. Khlobystov, S. Berber, and D. Tománek,
Phys. Rev. Lett. 102 195503 (2009)
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Probing the Magnetic Exchange Forces
of Iron on the Atomic Scale
R. Schmidt, C. Lazo, H. Hölscher, U. H. Pi, V. Caciuc, A. Schwarz, R. Wiesendanger, and S. Heinze,
Nano Letters 9 200 (2009)
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Evaluating local properties of magnetic tips utilizing an antiferromagnetic surface
U. Kaiser, A. Schwarz, and R. Wiesendanger,
Phys. Rev. B 78 104418 (2008)
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Atomically resolved mechanical response of individual metallofullerene molecules confined inside carbon nanotubes
M. Ashino, D. Obergfell, M. Haluška, S. Yang, A. N. Khlobystov, S. Roth, and R. Wiesendanger,
Nature Nanotechnology 3 337 (2008)
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Magnetic exchange force microscopy with atomic resolution
U. Kaiser, A. Schwarz, and R. Wiesendanger,
Nature 446 522 (2007)
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MExFM - A New Force Microscopy Based Technique to Study Atomic Scale Magnetism
A. Schwarz,
Conference Proceedings EAST 2007 1 32 (2007)
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Atomic-Resolution Dynamic Force Microscopy and Spectroscopy of an Individual Single-Walled Carbon Nanotube
M. Ashino and R. Wiesendanger,
Jpn. J. Appl. Phys. 45 (3B) 2286 (2006)
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Interpretation of the atomic scale contrast obtained on graphite and single-walled carbon nanotubes in the dynamic mode of atomic force microscopy
M. Ashino, A. Schwarz, H. Hölscher, U.D. Schwarz, and R. Wiesendanger,
Nanotechnology 16 134 (2005)
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Atomic-resolution dynamic force microscopy and spectroscopy of a single walled carbon nanotube: characterization of interatomic van der Waals forces.
M. Ashino, A. Schwarz, T. Behnke, and R. Wiesendanger,
Phys. Rev. Lett. 93 136101 (2004)
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Three-dimensional force field spectroscopy.
A. Schwarz, H. Hölscher, S. M. Langkat, and R. Wiesendanger,
Proc. STM´03 Conference, Eindhoven, NL (eds. P. M. Koenraad and M. Kemerink), AIP Conf. Proc. 696 68 (2003)
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A cryogenic scanning force microscope for the characterization of frozen biological samples
J.H. Müller, U.D. Schwarz, R. Wepf, and R. Wiesendanger,
Appl. Phys. A 76 893 (2003)
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Determination of site specific interatomic forces between an iron coated tip and the NiO(001) surface by force field spectroscopy.
S. M. Langkat, H. Hölscher, A. Schwarz, and R. Wiesendanger,
Surf. Sci. 527 12 (2003)
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Measurement of three-dimensional force fields with atomic resolution using dynamic force spectroscopy.
H. Hölscher, S. M. Langkat, A. Schwarz, and R. Wiesendanger,
Appl. Phys. Lett. 81 4428 (2002)
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Dynamic force microscopy with atomic resolution at low temperatures.
A. Schwarz, U. D. Schwarz, S. Langkat, H. Hölscher, W. Allers, and R. Wiesendanger,
Applied Surface Science 188 245 (2002)
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Comment on "Damping mechanism in dynamic force microscopy"
H. Hölscher, B. Gotsmann, W. Allers, U. D. Schwarz, H. Fuchs, and R. Wiesendanger,
Phys. Rev. Lett. 88 019601 (2001)
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Measurement of conservative and dissipative tip-sample interaction forces with a dynamic force microscope using the frequency modulation technique.
H. Hölscher, B. Gotsmann, W. Allers, U. D. Schwarz, H. Fuchs, and R. Wiesendanger,
Phys. Rev. B 64 075402 (2001)
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Low-temperature dynamic force microscopy on nickel oxide(001)
W. Allers, S. Langkat, and R. Wiesendanger,
Appl. Phys. A 72 27 (2001)
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Atomic resolution in scanning force microscopy: Concepts, requirements, contrast mechanisms, and image interpretation.
U.D. Schwarz, H. Hölscher, and R. Wiesendanger,
Phys. Rev. B 62 13089 (2000)
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Detection of doping atom distributions and individual dopants in InAs(110) by dynamic mode scanning force microscopy in ultrahigh vacuum
A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger,
Phys. Rev. B 62 13617 (2000)
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Interpretation of ´true atomic resolution´ images of graphite(0001) in non-contact atomic force microscopy.
H. Hölscher, W. Allers, A. Schwarz, U. Schwarz, and R. Wiesendanger,
Phys. Rev. B 62 13617 (2000)
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Quantitative Analysis of Dynamic-Force-Spectroscopy Data on Graphite (0001) in the Contact and Noncontact Regimes.
H. Hölscher, A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger,
Phys. Rev. B 61 12678 (2000)
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Dynamic mode scanning force microscopy study of n-InAs(110)-(1x1) at low temperatures.
A. Schwarz, W. Allers, U.D. Schwarz, and R. Wiesendanger,
Phys. Rev. B 61 2837 (2000)
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Dynamic scanning force microscopy at low temperatures
W. Allers, A. Schwarz, H. Hölscher, U. D. Schwarz, and R. Wiesendanger,
Jpn. J. Appl. Phys. 39 3701 (2000)
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Determination of tip-sample interaction potentials by dynamic force spectroscopy
H. Hölscher, W. Allers, U. D. Schwarz, A. Schwarz, and R. Wiesendanger,
Phys. Rev. Lett. 83 4780 (1999)
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Dynamic scanning force microscopy at low temperatures on a noble gas crystal: Atomic resolution on the xenon(111) surface
W. Allers, A. Schwarz, U. D. Schwarz, and R. Wiesendanger,
Europhys. Lett. 48 276 (1999)
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Dynamic scanning force microscopy at low temperatures on a van der Waals surface: graphite(0001)
W. Allers, A. Schwarz, U. D. Schwarz, and R. Wiesendanger,
Appl. Surf. Sci. 140 247 (1999)
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Simultaneous imaging of the In and As sublattice on InAs(110)-(1x1) with dynamic scanning force microscopy
A. Schwarz, W. Allers, U. D. Schwarz, and R. Wiesendanger,
Appl. Surf. Sci. 140 293 (1999)
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Calculation of the frequency shift in dynamic scanning force microscopy
H. Hölscher, U. D. Schwarz, and R. Wiesendanger,
Appl. Surf. Sci. 140 344 (1999)
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Analysis of electrical breakdown failures by means of SFM-based methods
A. Born, A. Olbrich, M. Mayvald, and R. Wiesendanger,
Appl. Phys. A 66 1063 (1998)
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The velocity dependence of frictional forces in point contact friction
O. Zwörner, H. Hölscher, U.D. Schwarz, and R. Wiesendanger,
Appl. Phys. A 66 263 (1998)
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Consequences of the stick-slip movement for the scanning force microscopy imaging of graphite
H. Hölscher, O. Zwörner, U.D. Schwarz, and R. Wiesendanger,
Phys. Rev. B 57 2477 (1998)
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A scanning force microscope with atomic resolution in ultrahigh vacuum and at low temperatures
W. Allers, A. Schwarz, U. D. Schwarz, and R. Wiesendanger,
Rev. Sci. Instr. 69 221 (1998)
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Reibung auf der Nanometerskala - Nanotribilogie mit dem Rasterkraftmikroskop
U. D. Schwarz and H. Hölscher,
Phys. Bl. 54 1127 (1998)
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Modelling of the scan process in lateral force microscopy
H. Hölscher, U.D. Schwarz, and R. Wiesendanger,
Surf. Sci. 375 395 (1997)
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Electrostatic force microscopy on ferroelectric crystals in inert gas atmosphere
H. Bluhm, A. Wadas, R. Wiesendanger, K.-P. Meyer, and L. Szczesniak,
Phys. Rev. B 55 4 (1997)
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Tip-sample interaction in contact force microscopy
U.D. Schwarz, H. Hölscher, H. Bluhm, O. Zwörner, and R. Wiesendanger,
PTB-Bericht F 30 1 (1997)
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Nanomechanical investigations and modifications of thin films based on scanning force methods
W. Allers, C. Hahn, M. Löhndorf, S. Lukas, S. Pan, U.D. Schwarz, and R. Wiesendanger,
Nanotechnology 7 346 (1996)
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Simulation of a scanned tip on a NaF(001) surface in friction force microscopy
H. Hölscher, U.D. Schwarz, and R. Wiesendanger,
Europhys. Lett. 36 16 (1996)
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Quantitative analysis of lateral force microscopy experiments
U.D. Schwarz, P. Köster, and R. Wiesendanger,
Rev. Sci. Instr. 67 2560 (1996)
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Load-dependent topographic and friction studies of individual ion tracks in layered materials by scanning and lateral force microscopy
M. Seider, U.D. Schwarz, and R. Wiesendanger,
Phys. Rev. B 53 16180 (1996)
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Issues of atomic-resolution structure and chemical analysis by scanning probe microscopy and spectroscopy
M. Bode, R. Pascal, W. Allers, U.D. Schwarz and R. Wiesendanger,
J. Vac. Sci. & Tech. A 14 1161 (1996)
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Domain Structure of Co/Pt Multilayers studied by Magnetic Force Microscopy
M. Löhndorf, A. Wadas, R. Wiesendanger, and H.W. van Kesteren,
J. Vac. Sci. & Tech. B 14 1214 (1996)
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