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Atomic Force Microscopy (AFM) on Insulators

Forces traced down to individual atoms

We use atomic force microscopy, also known as scanning force microscopy (SFM), to study well defined surfaces on the atomic scale. Besides true atomic resolution, the distance dependence of the forces on specific atomic sites is of particular interest for us. Currently, our most challenging scientific aim is to combine the atomic resolution capability of AFM with the magnetic sensitivity of magnetic force microscopy (MFM) to perform exchange force microscopy, i.e., the detection of the exchange force between spins of individual surface atoms and a magnetic atom at the tip end.

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